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MULTI CHANNEL SEMICONDUCTOR TEST SYSTEM WITH HIGH VOLTAGE OR HIGH CURRENT. |
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SUITED FOR HIGH SPEED OPEN, SHORT, LEAKAGE PCB AND COMPONENT TESTING. |
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OPTION FOR 2 TO 1024 OUTPUT TEST CHANNELS. |
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FLEXIBLE CONFIGURATION UP TO 100 PROGRAMMABLE TEST AND MEASURE STEPS. |
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CAPABLE OF INTEGRATING UP TO 10 INDEPENDENT SOURCE MEASURE UNITS (SMU). |
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MULTIPLE CURRENT AND VOLTAGE RANGE TO INCREASE ACCURANCY, FLEXIBILITY AND SPEED. |
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OPTION FOR MULTIPLE TEST OR LOAD BOARDS IN ORDER TO PROVIDE MULTI CHANNEL SOURCING AND MEASURING THROUGH SMU BOARD. |
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TRUE 4 QUADRAT SOURCING CAPABILITY FOR EACH CHANNEL. |
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THRYSTER EFFECT TEST CAPABILITY. |
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4 WIRE TEST METHODOLOGY WITH KELVIN SENSE. |
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STABLE RATED ANALOG POWER SUPPLY IN ORDER TO ENSURE LOW NOISE RIPPLE TO TEST CIRCUITS. |
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CUSTOM SOFTWARE INTERFACE WITH NETWORK CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING. |
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INTERFACE RS-232, RS-485, USB, 32-bit Opto-Isolated I/O. |
